TESCAN AMBER - UHR-SEM Combined with FIB for Sample Preparation

The TESCAN AMBER UHR-SEM system has been developed with versatility in mind. The system serves both nanoscale sample characterization and daily FIB applications in the materials research laboratory.

Thanks to the combination of its field-free ultra-high-resolution SEM and the advanced Ga+ FIB, the TESCAN AMBER is the desired solution for advanced materials characterization and high-precision micro-sample preparation.

The field-free UHR-SEM BrightBeam™ offers analytical performance and ultra-high-resolution imaging over the most extensive range of materials, whether it is magnetic, metallic, beam sensitive, or non-conductive.

The Orage™ FIB column has been developed to satisfy increasingly stringent focused ion beam sample preparation needs. Thanks to the maximum FIB resolution and an extensive range of beam current choices of the Orage™ FIB column, the TESCAN AMBER regularly delivers prepared samples of the highest quality.

The optional automation modules for multi-site operations and batch processing enable unsupervised implementation of preconfigured operations such as making micro-mechanical test sample arrays or creating TEM lamella at several sample locations.

In-column BSE and SE detectors have been improved for high-quality imaging at the FIB-SEM coincident point. The proprietary geometry for microanalytical tools provided in the TESCAN AMBER provides unparalleled analytical potential, not just for microanalysis but also for multimodal FIB-SEM nanoscale tomography.

Moreover, the Wide Field Optics™ provides wider fields of view at the lowest magnifications, enabling users to navigate to their region of interest quickly and simply with the help of the live SEM image.

TESCAN AMBER is driven by TESCAN Essence™, the company’s modular customizable graphical user interface, thus easily converting from a multi-user, multi-purpose workstation to a dedicated tool for sophisticated FIB operations.

Key Benefits

  • Ultra-high-resolution field-free SEM imaging and nanoanalysis
  • Outstanding low-keV ion beam performance
  • Micro-sample preparation of highest precision
  • Multimodal FIB-SEM nanotomography
  • Easy navigation and an extended field of view
  • User-friendly modular software interface
  • Multi-site FIB process automation